Scanning helium ion microscope

ID: scanning-helium-ion-microscope

A Scanning Helium Ion Microscope (HeIM) is a type of microscopic imaging tool that utilizes helium ions to produce high-resolution images of materials at the nanoscale. It provides several advantages over traditional electron microscopes, such as improved resolution, reduced charging effects on insulating samples, and the ability to image delicate structures without damaging them.

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