Scanning probe microscopy
ID: scanning-probe-microscopy
Scanning probe microscopy (SPM) is a branch of microscopy that utilizes a physical probe that scans the surface of a sample to obtain information about its topography and other properties at the nanoscale. Unlike conventional microscopy techniques that rely on light or electrons to visualize samples, SPM directly interacts with the surface at a very close range, allowing for high-resolution imaging and analysis.
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