Interference microscopy is an optical imaging technique that utilizes the principles of interference to visualize and analyze the surface and structural properties of materials at high resolution. This method is particularly useful for studying thin films, surface topography, and variations in refractive index, allowing for the observation of features that may be difficult to detect with conventional microscopy techniques. The fundamental concept behind interference microscopy is the use of coherent light sources, typically lasers, which produce light waves that can interfere with one another.
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