Low-Energy Ion Scattering (LEIS) is a surface analysis technique used to study the composition, structure, and properties of the outermost layers of solid materials. In LEIS, low-energy ions (typically in the range of a few keV) are directed at a sample surface. The interaction between the ions and the atoms in the surface leads to scattering events that can be analyzed to provide information about the surface composition and arrangement of atoms.
Articles by others on the same topic
There are currently no matching articles.