Photoemission electron microscopy

Photoemission Electron Microscopy (PEEM) is a sophisticated imaging technique that combines elements of photoemission spectroscopy and electron microscopy to obtain detailed information about the electronic properties of materials at the nanoscale. It allows researchers to visualize and analyze the distribution of electronic states and surface structures with high spatial resolution. The principle of PEEM is based on the photoelectric effect, where incident light—typically ultraviolet (UV) or X-ray radiation—excites electrons from the material's surface.