"X-Ray Spectrometry" is a peer-reviewed scientific journal that focuses on the field of X-ray spectrometry, which involves the analysis and characterization of materials using X-ray techniques. The journal publishes original research articles, reviews, and technical notes that cover advancements in techniques, applications, and developments related to X-ray spectrometry. Topics may include but are not limited to X-ray fluorescence (XRF), X-ray diffraction (XRD), and other X-ray-based analytical methods.
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