 Solution

With equal constant electron mobility and hole mobility $\mathcal{M}$, the sheet electrical conductivity is $\sigma =e\mathcal{M}(n+p)$. In the intrinsic regime, $n+p\simeq 2n_i\propto T{e}^{-E_g/(2k_{B}T)}$, soIt decreases steeply with increasing $1/T$ on the high-temperature side. There is a small logarithmic curvature rather than a perfectly straight activation line.

In the fully ionized extrinsic regime, charge neutrality and the semiconductor mass-action law give $n-p=n_d$, $np=n_i^2$, henceThis gives a nearly horizontal region passing through $\sigma (200\mathrm{K})=0.01{\Omega }^{-1}$. At lower temperatures semiconductor carrier freeze-out decreases the ionized donor density and bends the curve downward again.

To locate that bend realistically, include donor charge-state degeneracy. For a neutral donor with two spin states and an empty donor with one state, the ionized density isSolve $n-n_i^2/n=n_d^{+}$ for the mobile density. In the asymptotic freeze-out regime, where $p$ is negligible and $n\ll n_d$,Its activation scale $E_B/2\simeq 3.14\mathrm{meV}$ is much smaller than the intrinsic scale $E_g/2=180\mathrm{meV}$.

Within the specified interval the low-temperature downturn is modest: $N_c(30\mathrm{K})\simeq 2.81\times 10^{10}{\mathrm{cm}}^{-2}$, and the partial-ionization equation gives $n(30\mathrm{K})\simeq 0.65n_d$. The sample is not yet deep in the asymptotic freeze-out limit at 30 K. Calibrating the mobility to the stated 200 K value gives representative valuesThe donor statistical weights were not explicitly supplied, so they are a stated assumption for these illustrative curve details; a one-state donor approximation changes the low-temperature rounding but not the three physical regimes or their activation scales.