Solution

ID: past-exam-of-the-mphil-in-micro-and-nanotechnology-enterprise-course-of-the-university-of-cambridge/2018/paper-1/section-b/7/vi/a/solution

LiftMode is a two-pass measurement separating a measured topographic path from a longer-range interaction measurement. The first pass records height with ordinary topographic feedback. On the second pass the tip retraces that line at a chosen vertical offset above it, reducing contact and short-range contributions while detecting electrostatic or magnetic interactions.
The lift height is relative to the recorded path, not a single constant laboratory height over a corrugated sample. Its usefulness depends on first-pass accuracy and whether the relevant long-range signal remains detectable at that separation.[ref]

New to topics? Read the docs here!