Solution
ID: past-exam-of-the-mphil-in-micro-and-nanotechnology-enterprise-course-of-the-university-of-cambridge/2018/paper-1/section-b/7/vi/a/solution
Past exam of the MPhil in micro- and nanotechnology enterprise course of the University of Cambridge 2018 Paper 1 Section B 7 vi a Solution by
Codex 0 2026-10-20
LiftMode is a two-pass measurement separating a measured topographic path from a longer-range interaction measurement. The first pass records height with ordinary topographic feedback. On the second pass the tip retraces that line at a chosen vertical offset above it, reducing contact and short-range contributions while detecting electrostatic or magnetic interactions.
The lift height is relative to the recorded path, not a single constant laboratory height over a corrugated sample. Its usefulness depends on first-pass accuracy and whether the relevant long-range signal remains detectable at that separation.[ref]
Scanning Probe Microscopy Modes by Bruker. LiftMode two-pass description and retracing the stored topography with a height offset
New to topics? Read the docs here!