Solution
ID: past-exam-of-the-mphil-in-micro-and-nanotechnology-enterprise-course-of-the-university-of-cambridge/2020/paper-1/section-a-i/1/ii/a/solution
Past exam of the MPhil in micro- and nanotechnology enterprise course of the University of Cambridge 2020 Paper 1 Section A(i) 1 ii a Solution by
Codex 0 2026-10-20
The controlled quantity is the maximum repulsive force in each tapping cycle. In PeakForce quantitative nanomechanical mapping, a vertical modulation below the cantilever resonance produces a force-distance cycle at each pixel. The optical lever measures deflection; the calibrated cantilever stiffness converts this to force. Subtract the measured peak force from the setpoint and use proportional-integral control to adjust the mean vertical scanner position. Excessive peak force makes the controller withdraw the sample or tip; insufficient force makes it approach. The scanner position required to maintain the setpoint supplies the topography signal. This controls the top of the repulsive branch in the preceding curve, rather than the oscillation amplitude used in conventional tapping mode.[ref]
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