A secondary electron is emitted from a material after excitation by incident radiation or particles, rather than simply being a high-energy primary electron redirected back out. Many detected secondaries have low enough kinetic energy that escape strongly favors regions near a surface.
This makes secondary-electron collection useful for secondary-electron topographic contrast in a scanning electron microscope. Surface angle, local electric fields and collector bias affect the signal as well as emission itself. Backscattered primaries can also excite secondary electrons away from the probe's immediate landing position, so every detected secondary need not originate directly beneath the nominal probe.[ref]
Secondary electron by JEOL Ltd.. Surface-related emission and distinction between secondary-electron generation paths
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