Thomas J. Fellers is credited with Michael W. Davidson as an author of Linear Measurements (Micrometry) by Thomas J. Fellers and Michael W. Davidson, an educational account of quantitative optical microscopy. Its byline associates the authors with the National High Magnetic field Laboratory at Florida State University. [ref]
Linear Measurements (Micrometry) by Thomas J. Fellers and Michael W. Davidson. Contributing Authors byline
The account explains how a stage micrometer calibrates an eyepiece reticle. Matching a known specimen-plane length to reticle divisions converts an arbitrary scale into a physical measurement. Changing the objective lens changes that calibration, so magnification alone is insufficient for reliable microscopy. The article also discusses optical resolution and errors in locating scale edges. [ref]
Linear Measurements (Micrometry) by Thomas J. Fellers and Michael W. Davidson. Eyepiece Reticle Calibration, Figure 4; Conclusions
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