 Wringing-film uncertainty

Wringing-film uncertainty is the uncertainty contributed by differences or changes in the effective contact layers formed during gauge block wringing. Because the defined length of a gauge block includes a wringing-layer convention, the issue is the difference between calibration and use, not automatically an extra layer correction added to every certificate value.

For a stack of $n$ blocks wrung to an auxiliary plane, let $w_i$ denote each calibrated effective layer contribution and $w_j^{\prime }$ the contributions from the $n-1$ internal contacts plus the base contact in use. The residual contact correction isIts standard uncertainty requires a model for these differences. NIST's handbook describes dependence on surface condition, fluid and elapsed time, and notes residual uncertainty when an unknown block's layer is transferred through comparison with a master.^[ref]

An original model for $n$ effective contact differences writes ${\delta }_j=b+{ϵ}_j$, with one shared zero-mean contribution $b$ of variance $u_b^2$ and independent contact contributions ${ϵ}_j$ of variance $u_{ϵ}^2$. ThenThe common term grows quadratically in variance because every contact contains the same contribution. Treating all contacts as independent would omit their covariance.

For three contacts with stipulated $u_b=3\mathrm{nm}$ and $u_{ϵ}=2\mathrm{nm}$, the combined standard uncertainty is $\sqrt{9\cdot 9+3\cdot 4}=\sqrt{93}\approx 9.64\mathrm{nm}$. Assuming independence for three marginal uncertainties $\sqrt{13}\mathrm{nm}$ instead gives $\sqrt{39}\approx 6.24\mathrm{nm}$. The numerical difference comes entirely from the assumed shared effect; these values are illustrative, not a general wringing specification.

Repeatedly separating, preparing and rewringing contacts can characterize a repeatability contribution. Repeated detector readings of an unchanged stack do not sample new wrings. Averaging independent rewrings may reduce a random contact term while leaving a shared calibration or preparation contribution. Film evolution and thermal expansion during handling must also be distinguished from readout noise.

Report surface preparation, reference geometry, elapsed time and the treatment of shared effects. A stack that adheres firmly can still have a length contribution relevant to a small uncertainty target. Wringing-film covariance model assumptions therefore belong with the result, rather than being hidden inside an unspecified repeatability number.