Past exam of the MPhil in micro- and nanotechnology enterprise course of the University of Cambridge / 2018 / Paper 1 / Section A(iii) / 5 / i / Solution 2026-10-20
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In contact-mode atomic force microscopy, a sharp tip on a compliant cantilever remains in contact with the surface while a feedback loop controls its normal deflection. A laser reflected from the cantilever onto a position-sensitive detector converts bending into an electrical error signal. With calibrated deflection and stiffness , the normal force is approximately under the stated contact convention.
A piezoelectric scanner raster-scans the sample or tip. The controller adjusts vertical position to maintain the chosen deflection setpoint; that vertical displacement is recorded as topography. The right panel of the microscopy diagram identifies tip, cantilever, optical deflection readout, controller and vertical actuator.
Figure 1.
Original instrument diagrams; the right panel shows contact-mode atomic force microscopy and the recorded vertical feedback signal
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The result is a probe-accessible surface, affected by finite tip shape, sample deformation, adhesion and feedback bandwidth. Lateral friction can distort or damage a soft surface, so constant deflection is not a guarantee of unchanged specimen structure.
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