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An AFM approach using calibrated side-sensitive tip geometry and position control to measure steep or reentrant features. A flared tip can reach surfaces that an ordinary tapered probe cannot; calibration must account for its effective width.^[ref]

A conventional tapping tip tapers toward its apex, so its shank contacts an overhanging feature before its apex can probe underneath it. Critical-dimension atomic force microscopy instead uses a calibrated flared or laterally extended tip, with a relatively narrow neck and side-sensitive control. The lateral extension can contact a reentrant sidewall while the neck clears the upper edge. The measured profile still includes the tip's finite shape and must be interpreted with a tip calibration; changing the tip does not automatically eliminate all convolution errors.^[ref]

Lateral oscillation or dithering is added to the vertical oscillation. It provides a tip-sidewall interaction signal that can drive lateral feedback while the vertical channel maintains height control. This is how a suitable flared tip can track steep or reentrant walls. Treating the additional signal as merely a larger vertical tapping amplitude would not supply the required sidewall sensing.^[ref]

A researcher in nanoscale metrology who coauthored studies of width measurements with atomic force microscopy. A shaped probe senses steep sidewalls, but its lateral motion changes the effective width that must be subtracted from a measurement. The work examined calibration under matched conditions, showing why a microscope's control method is part of the measurement model.^[ref]