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Generation increases the mobile electron or hole populations; interband excitation creates an electron-hole pair. Thermal excitation and absorbed photons are important sources, and impact ionization can multiply carriers in a strong field. Ordinary single-photon interband absorption needs enough photon energy to bridge the band gap, with the required momentum balance.

Electron-hole recombination removes a pair. Radiative electron-hole recombination emits a photon, with simple rate $Bnp$; trap-assisted electron-hole recombination uses localized defect levels and transfers energy to the lattice; Auger recombination transfers the electron-hole recombination energy to another carrier. The last process becomes especially important at high injection because its rate contains products such as $n^{2}p$ and $n{p}^2$. The detailed band structure and available defects determine which channel dominates.

At thermal thermodynamic equilibrium, generation and electron-hole recombination continue at equal rates. For the simple radiative model the net electron-hole recombination rate is $B(np-n_i^2)$, enforcing the semiconductor mass-action law. Under weak excitation with the majority density nearly fixed, an excess minority density often decays as $\Delta n(t)=\Delta n(0)e^{-t/\tau }$, defining its minority carrier lifetime.

A short light pulse followed by time-resolved electrical conductivity or luminescence measures the relaxation. Spatial diffusion, trapping and instrumental response must be separated from electron-hole recombination before identifying a single fitted decay constant with the intrinsic lifetime. These processes control photodetector response and light-emitting-device efficiency.