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A nested wringing-repeatability study separates variation between independently prepared gauge block wringings from readout scatter within one unchanged wring. Repeating a detector reading many times does not sample the contact variability introduced by separating and rejoining the surfaces.

For $m$ wrings with $r$ readings each, an original balanced random effect model iswhere independent wring effects have variance ${\tau }^2$ and independent readout errors have variance ${\sigma }^2$. Assume stable conditions and independence between those levels. One-way analysis of variance givesThus $M{S}_W$ estimates readout variance and $(M{S}_B-M{S}_W)/r$ estimates the between-wring variance in this model. A negative variance estimate reflects sampling variability or model limitations, not a physically negative contact variance.

For a small invented data set, duplicate readings in nm relative to an arbitrary reference are $(-3,-1)$, $(1,3)$ and $(5,7)$. Wring means are $-2,2,6$; $M{S}_W=2$ and $M{S}_B=32$, so the method-of-moments between-wring variance is $15\mathrm{n}{\mathrm{m}}^2$. These are arithmetic examples, not a recommended sample size or a NIST calibration result.

For the overall mean of the balanced study,With stipulated $\tau =6\mathrm{nm}$, $\sigma =2\mathrm{nm}$, five wrings and four readings per wring, its standard deviation is $\sqrt{7.4}\approx 2.72\mathrm{nm}$. Increasing to forty readings on the same five wrings lowers it only to about 2.69 nm. Fifty wrings with four readings each would instead give about 0.86 nm, if the same model and stable preparation remain valid.

A shared reference or persistent preparation contribution does not disappear under either averaging rule. An independent common uncertainty $u_0$ adds $u_0^2$ to the displayed variance. This connects the nested study with the wringing-film covariance model and the gauge-block reference uncertainty floor.

NIST's handbook documents contact-layer dependence on preparation and time, including evolution after thermal equilibration.^[ref] Record rewringing events, timestamps and surface preparation; use appropriate controls for drift and damage. A nested contact-study allocation should balance new wrings against repeat readings, rather than treating every reading as an independent contact experiment.

Wringing-film uncertainty is the uncertainty contributed by differences or changes in the effective contact layers formed during gauge block wringing. Because the defined length of a gauge block includes a wringing-layer convention, the issue is the difference between calibration and use, not automatically an extra layer correction added to every certificate value.

For a stack of $n$ blocks wrung to an auxiliary plane, let $w_i$ denote each calibrated effective layer contribution and $w_j^{\prime }$ the contributions from the $n-1$ internal contacts plus the base contact in use. The residual contact correction isIts standard uncertainty requires a model for these differences. NIST's handbook describes dependence on surface condition, fluid and elapsed time, and notes residual uncertainty when an unknown block's layer is transferred through comparison with a master.^[ref]

An original model for $n$ effective contact differences writes ${\delta }_j=b+{ϵ}_j$, with one shared zero-mean contribution $b$ of variance $u_b^2$ and independent contact contributions ${ϵ}_j$ of variance $u_{ϵ}^2$. ThenThe common term grows quadratically in variance because every contact contains the same contribution. Treating all contacts as independent would omit their covariance.

For three contacts with stipulated $u_b=3\mathrm{nm}$ and $u_{ϵ}=2\mathrm{nm}$, the combined standard uncertainty is $\sqrt{9\cdot 9+3\cdot 4}=\sqrt{93}\approx 9.64\mathrm{nm}$. Assuming independence for three marginal uncertainties $\sqrt{13}\mathrm{nm}$ instead gives $\sqrt{39}\approx 6.24\mathrm{nm}$. The numerical difference comes entirely from the assumed shared effect; these values are illustrative, not a general wringing specification.

Repeatedly separating, preparing and rewringing contacts can characterize a repeatability contribution. Repeated detector readings of an unchanged stack do not sample new wrings. Averaging independent rewrings may reduce a random contact term while leaving a shared calibration or preparation contribution. Film evolution and thermal expansion during handling must also be distinguished from readout noise.

Report surface preparation, reference geometry, elapsed time and the treatment of shared effects. A stack that adheres firmly can still have a length contribution relevant to a small uncertainty target. Wringing-film covariance model assumptions therefore belong with the result, rather than being hidden inside an unspecified repeatability number.