 Particle-induced X-ray emission

Particle-induced X-ray emission (PIXE) is an analytical technique used to determine the elemental composition of various materials. It involves bombarding a sample with high-energy particles, typically protons or alpha particles, which causes the emission of characteristic X-rays from the atoms in the sample. ### Key Steps of the PIXE Process: 1. **Sample Irradiation**: The sample is hit by a beam of high-energy particles.