Franz Josef Giessibl is a prominent physicist known for his contributions to the field of nanotechnology and scanning probe microscopy. He is particularly recognized for his work on atomic-scale investigations using atomic force microscopy (AFM). Giessibl's research includes the development of advanced techniques that allow for high-resolution imaging and manipulation of surfaces at the atomic level. His work has significant implications in materials science, physics, and engineering, enhancing our understanding of the properties of materials at the nanoscale.
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