Kelvin probe force microscope

A Kelvin Probe Force Microscope (KPFM) is a sophisticated scanning probe microscopy technique used to measure the surface potential of materials at the nanoscale. It combines the principles of atomic force microscopy (AFM) with the Kelvin probe technique to provide detailed information about the electronic properties and work function of surfaces. ### Key Concepts 1. **Surface Potential Measurement**: KPFM is primarily used to map the surface potential of conductive and semiconducting materials.