Tip-enhanced Raman spectroscopy (TERS) is a powerful analytical technique that combines the principles of Raman spectroscopy with scanning probe microscopy (SPM), often utilizing a scanning tunneling microscope (STM) or atomic force microscope (AFM). This technique enables the study of materials at the nanoscale, providing enhanced spatial resolution and sensitivity compared to conventional Raman spectroscopy.

Articles by others on the same topic (0)

There are currently no matching articles.