X-ray Absorption Spectroscopy (XAS) is a powerful analytical technique used to study the electronic and structural properties of materials at the atomic level. It involves the measurement of the absorption of X-rays by a sample as a function of energy. The technique provides information about the oxidation state, coordination geometry, and local environment of specific elements within a material.
Articles by others on the same topic
X-ray absorption spectroscopy measures a material's absorption response as the incident photon energy is scanned. Near a core-electron threshold, the X-ray can excite or remove a bound electron, creating an absorption edge. The edge position and surrounding spectral structure carry information about the absorbing element and its electronic and local atomic environment.
In a transmission experiment, upstream and downstream detectors measure and . For a uniform sample of thickness obeying the simple attenuation model, . A synchrotron radiation source and a tunable monochromator can supply the energy scan; energy calibration, sample thickness and detector response enter the measurement model. X-ray absorption fine structure studies the variations around and beyond the edge, rather than only its threshold position.