Gate-width jitter is shot-to-shot variation in the duration of a detection time gate. If its opening and closing times are , then . Both edges can have substantial gate timing jitter while their difference remains stable. A common shift changes delay without changing width.
For small timing fluctuations,With equal edge standard deviations and correlation coefficient , this becomes . The covariance identity is exact whenever those variances exist. It separates width stability from the jitter of either edge measured alone.
For an original example, let both edges have standard deviation . Independent edge errors give ; correlation instead gives . At nominal width , those are relative width fluctuations of about 1.414 percent and 0.1414 percent. Assuming independence would overestimate the second width uncertainty by a factor of ten.
If a flat, baseline-corrected electric current fills the gate, the integrated electric charge is , so . At the nominal charge is , with respective standard deviations and . A varying waveform also introduces sensitivity to where the edges fall; the gate timing jitter article gives the general edge-current formula.
A gate-normalized detector output can report instead of charge. For an exactly constant current and accurately known actual width, that ratio is despite width variation. Dividing by a fixed nominal width instead retains the width-induced variation. The SR250 documentation describes integration followed by gate-width normalization, and provides a gate monitor for checking timing.[ref]
SR250 Gated Integrator by Stanford Research Systems. PDF pp. 1–2, Overview, Gate Timing and Additional Outputs
An apparatus check measures both edges relative to a common reference over repeated triggers and computes their difference for each shot. Measuring the two edge jitter distributions separately without their covariance cannot determine width jitter. Readout time resolution and the threshold used to define an edge are also part of that measurement.
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