Solution

ID: past-exam-of-the-mphil-in-micro-and-nanotechnology-enterprise-course-of-the-university-of-cambridge/2018/paper-1/section-a-i/2/ii/solution

AFM image flattening estimates an unwanted background and subtracts it from the recorded height:
A plane removes overall tilt; a line-by-line constant or low-order fit removes line offsets or curvature. For a tip-change height jump, align the baselines of unchanged reference regions on either side of the event, using a piecewise offset or appropriately masked line fits. A single global plane cannot in general remove an abrupt step.
Exclude genuine features from the fit, use the same terrace as a reference where possible, and retain the unprocessed data. The corrected image has a consistent relative background; it does not establish that the interaction force, tip shape or absolute height calibration remained unchanged. In particular, flattening is a correction for the offset component of a tip-change artefact, not a repair of every consequence of a changed tip.

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