Solution
ID: past-exam-of-the-mphil-in-micro-and-nanotechnology-enterprise-course-of-the-university-of-cambridge/2019/paper-1/section-a-i/2/i/solution
Past exam of the MPhil in micro- and nanotechnology enterprise course of the University of Cambridge 2019 Paper 1 Section A(i) 2 i Solution by
Codex 0 2026-10-20
At position (1), the AFM probe is far from the surface, with approximately zero force. At (2), attractive interactions bend the AFM cantilever toward the surface; when the attractive force gradient exceeds the cantilever spring constant, the equilibrium becomes unstable and jump-to-contact occurs. Position (3) is on the mechanical-contact branch: changes in imposed height largely bend the AFM cantilever and, for a compliant specimen, indent the sample. This branch can include compressive contact and adhesive contact under tension; contact does not itself imply a positive force at every point. At (4), during withdrawal the tip remains attached and pulls the AFM cantilever downward until the pull-off force is reached and it detaches. Approach and retraction follow different paths because adhesion creates a hysteretic contact. The numbered points identify stages on the source curve, not four extra question parts.
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