 Solution

friction force microscopy records cantilever torsion caused by lateral tip–sample force. Choose the detector sign so that friction on a flat region contributes positively during a left-to-right trace. On a common laboratory-position axis, write the two signals schematically asHere $B$ is an offset and $G$ represents a slope-related lateral-force or detector cross-talk contribution. A reversed electronic convention reverses all plotted signs without changing the physical conclusions.

At the same controlled normal contact force $N$, the flat-region contribution is approximately $F_f=\mu N$. The lower perovskite structure plateaux give a larger trace–retrace separation than the upper inorganic surface, because their coefficient of kinetic friction is larger. Genuine friction reverses sign with scan direction, so a larger friction magnitude means a higher positive trace and a more negative retrace in this convention.

Sloped edges produce additional peaks or shoulders. The normal reaction to a slope has a lateral component, and the finite tip flank can contact the rim, so edge contrast is not a direct map of the local friction coefficient. With the two scans registered and load control maintained,The half-difference therefore emphasizes friction while the half-sum diagnoses common geometrical contributions. Real contact mechanics and imperfect registration can prevent exact cancellation. The bottom panel of the figure shows these two kinds of contrast separately.