 Ultramicrotomy

Ultramicrotomy prepares extremely thin physical sections by advancing a specimen block through a controlled increment and cutting across it with an ultramicrotome. A diamond knife or suitable glass knife removes the section; collected sections can then be examined by transmission electron microscopy. The instrument's feed setting and the geometry of the recovered section are related quantities, but they need not be equal. JEOL explicitly notes dependence on specimen material and temperature.^[ref]

For a materials example, consider a polymer block containing an initially $20.0\mu \mathrm{m}$-long marked interval parallel to the cutting direction. Suppose the recovered section measures $17.0\mu \mathrm{m}$ along that interval, with unchanged transverse width. Its section compression is $1-17/20=15\%$. Under an explicitly ideal volume-conserving model, a nominal $60\mathrm{nm}$ layer would then have recovered thicknessThe altered area and thickness give the same model volume: $0.85\cdot 70.6\simeq 60$. This is an original diagnostic calculation, not a universal correction rule. Material loss, transverse strain or nonuniform deformation would invalidate the model.

A motivating preparation check therefore compares dimensions of recognizable material features before cutting and in the recovered section, while recording cutting direction and specimen conditions. An independent thickness measurement tests whether the feed is a good depth calibration. Image registration can align section images but cannot generally reverse unknown physical deformation. For serial-section electron microscopy, preserve section order and gaps in the image stack as well as the chosen image stack axis calibration.