Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene by Jannik C. Meyer and others (2012)

doi.org/10.1103/PhysRevLett.108.196102

arxiv.org/abs/1203.2372

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Past exam of the MPhil in micro- and nanotechnology enterprise course of the University of Cambridge / 2021 / Paper 1 / 2 / ii / Solution

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