Qiang-Fu Created 2026-10-13 Updated 2026-11-05
Coauthored an antibody study using atomic force microscopy to investigate pulling-induced partial unfolding. Reversible probe-history effects supported a metastable antibody state affecting recognition imaging and comparisons with surface plasmon resonance. [ref]
Antibody-Unfolding and Metastable-State Binding in Force Spectroscopy and Recognition Imaging by Parminder Kaur and others. Page 243: printed Qiang-Fu byline and abstract; page 249: Conclusions.
Ronald G. Dixson Created 2026-10-20 Updated 2026-11-05
A researcher in nanoscale metrology who coauthored studies of width measurements with atomic force microscopy. A shaped probe senses steep sidewalls, but its lateral motion changes the effective width that must be subtracted from a measurement. The work examined calibration under matched conditions, showing why a microscope's control method is part of the measurement model.[ref]
Effects of Lateral Tip Control in CD-AFM Width Metrology by Ronald G. Dixson and others. NIST abstract: flared tips, lateral dither, effective width and calibration conditions
Stuart Lindsay Created 2026-10-13 Updated 2026-11-05
A biophysics researcher whose joint study connected rapid switching in atomic force microscopy recognition images with mechanically induced changes in an antibody. The work tests how the measurement apparatus itself can alter molecular recognition.[ref]
Antibody-Unfolding and Metastable-State Binding in Force Spectroscopy and Recognition Imaging by Parminder Kaur and others. Abstract and recognition-imaging results: reversible structural changes and switching
Surface topography 2026-10-20
The spatial height and shape of a surface. In atomic force microscopy, apparent lateral shape also depends on AFM tip convolution and the controller response.
Tunnelling atomic force microscopy 2026-10-20
Current-sensitive atomic force microscopy using a conducting tip and a low-current amplifier. A steady conductivity map requires a complete electrical path through the contacted specimen region, even when force-based topography can be recorded without it.