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Andre Geim, Konstantin Novoselov and collaborators mechanically cleaved graphite, identified thin flakes, and fabricated multi-terminal Hall bars on oxidized silicon. A substrate gate changed the carrier density; longitudinal electrical resistance and the Hall coefficient supplied different checks. The 2004 report included one-, two- and three-layer devices and described a few-layer semimetal interpretation. Layer identification and electrical control were separate experimental achievements.^[ref]

The 2005 monolayer study used an optical microscope, electron microscopy and atomic force microscopy to select monolayers. It then measured Shubnikov-de Haas oscillations as temperature, gate voltage and magnetic field varied. Their damping inferred a density-dependent cyclotron effective mass; comparison with oscillation frequency tested a linear dispersion relation. A comparison with two-layer devices also distinguished their quantum Hall effect sequences. These are complementary tests of the monolayer model, rather than consequences of finding a thin-looking flake alone.^[ref]

Translate the liquid past a bead held in a stationary harmonic optical trap. At steady mean position, take $u$ as the local fluid velocity relative to the fixed trap and $x$ positive downstream. Averaging the overdamped force balance givesFor the invented Optical trap Langevin calibration example, $u=50.0\mu m/s$ predicts $⟨x⟩=23.562\mathrm{nm}$, $V-V_0=0.23562\mathrm{V}$, and $\zeta u=k⟨x⟩=0.47124\mathrm{pN}$. Reversing $u$ reverses the mean shift but leaves the ideal thermal variance unchanged. A symmetric speed sweep tests the offset and the linear force range; the slope determines $\zeta /k$ if position is calibrated.

Near a wall, $\zeta =6\pi \eta a$ is not the appropriate drag without a boundary correction; record bead height and direction of motion. Stage velocity must correspond to the local fluid velocity after transients have settled. Escape under increasing flow estimates a maximum holding force in that geometry, whereas small-displacement drag calibration estimates the local spring constant. They are different quantities. The atomic force microscopy similarly needs a calibrated spring constant to convert a measured deflection to force, but its cantilever is a physical spring rather than this optical field.

During slow peeling in atomic force microscopy, $n$ adjusts to minimize the Helmholtz free energy at each imposed height. Define the positive binding gain $\mu =k_{B}T[ϵb/\xi -(b/\xi {)}^2]$ for the adsorbed segment. The stationary point satisfiesSince ${\partial }_n^{2}F=3k_{B}T{z}^2/(b^2{n}^3)>0$, this is a minimum while $0<n_{\ast }<N$. The upward pulling force is the height derivative of the minimized free energy. The implicit $n_{\ast }(z)$ term vanishes because ${\partial }_{n}F=0$, givingUsing $\xi =2b/ϵ$,It is independent of $z$: extra pulling height releases more monomers while leaving the fractional extension of the stretched part unchanged. Equivalently $F_{\min }=-N\mu +f_{\mathrm{peel}}z$. This is the equilibrium peeling force of an adsorbed Gaussian chain.

The plateau ends when $n_{\ast }=N$, atThereafter all monomers are detached and the Gaussian chain force is $f=3k_{B}Tz/(N{b}^2)$, agreeing continuously with the plateau at $z_{\det }$. Very near the start and final release, finite-chain and junction effects lie outside the blob approximation.