Atomic force microscope 2026-10-20
An atomic force microscope measures interactions through the deflection or dynamics of a calibrated compliant cantilever. In a static force curve, calibrated deflection and spring constant give ; converting stage position to a surface gap also requires the bending correction and a contact reference. The colloidal probe technique replaces a sharp probe with a sphere of controlled radius.
The literal curve is monotone increasing from at toward zero from below as :Taken literally at a zero gap, it predicts an unbounded collapse energy and force. That extrapolation is outside the far-field dipole approximation and cannot describe actual touching matter.
Finite atomic/ionic dimensions, electronic overlap and Pauli repulsion supply short-distance constraints. Solvent and hydration layers, steric coatings and surface chemistry can add further contributions. An illustrative regularized model is with ; it has a finite minimum at and becomes repulsive at shorter distances. This is a schematic regularization, not a derived complete ion–sphere contact law.
Separately, correcting the center-distance convention to already removes this particular divergence from the far-field expression, but does not make a dipole approximation accurate at contact. Near-field multipoles and microscopic repulsion still require a better model. Calibrated colloidal probe technique measurements can test where a long-range force model ceases to agree with actual approach curves.[ref]
direct measurement of colloidal forces using an atomic force microscope by William A. Ducker and others. 1991, pp.239–241, sphere–plane force measurements and short-range deviations
Past exam of the quantum condensed matter course of the University of Cambridge 2006 Section A A3 b Solution Created 2026-10-18 Updated 2026-10-20
Use the colloidal probe technique: attach a sphere of known radius to the cantilever of an atomic force microscope and approach a chemically matched planar surface in the same liquid as the suspension. A laser reflected from the cantilever measures its deflection ; calibration of the spring constant converts this to force, . The surface separation is reconstructed from piezo motion after correcting for cantilever bending and defining the contact position. Slow approach reduces hydrodynamic drag; residual surface charge, roughness and hydration must be controlled when identifying a dispersion force.
The Derjaguin approximation accounts for the geometry. With interaction free energy per area between flat plates, , where for a sphere and plane but for equal spheres. Since , the sphere-plane force is ; divide it by two to infer the equal-sphere result in the same near-contact approximation. Attractive force gradients can produce a jump to contact, limiting the directly accessible approach curve.
An actual demonstration attached a silica sphere of radius to an AFM force sensor and measured its interaction with a plane in sodium chloride solutions. Its double-layer contribution and short-distance deviations show why charge and surface conditions must be measured rather than simply presumed absent.[ref]
William A. Ducker 2026-10-20
A surface-chemistry researcher whose work includes the colloidal probe technique for measuring forces with an atomic force microscope.
