A. Gow 2026-11-05
A. Gow is the first author of a 1999 study testing the function of Claudin-11 in myelin and between Sertoli cells. Mice lacking the corresponding gene had slowed nerve conduction and reproductive abnormalities. Freeze-fracture microscopy showed the absence of characteristic tight junction strands in the affected membrane structures.[ref]
The structural observation narrows the interpretation of the whole-animal changes: a defined membrane component was missing where a particular junctional pattern normally occurs. Absence of those tight junction strands should not be read as absence of all myelin. Combining molecular deletion, microscopy and physiological measurements connected Claudin-11 with junction formation in two different tissue settings.[ref]
Freeze-etching 2026-11-05
Freeze-etching removes surface ice from a frozen specimen by sublimation under vacuum, often after freeze-fracture microscopy has exposed a new face. Removing that ice can reveal structures initially hidden beneath it. Fracturing opens the specimen mechanically; etching subsequently changes the exposed surface by removing material.[ref]
A physical preparation holds the specimen cold in a controlled vacuum, permits a chosen amount of ice removal, and then applies the coating appropriate for electron microscopy. The exposed block face can be examined with a scanning electron microscope, or a supported replica can be examined by transmission electron microscopy. Coating and transfer preserve information about a prepared face rather than making the original bulk material transparent.[ref]
For an own geometrical model, suppose a flat ice surface recedes uniformly at while an embedded feature does not sublime. A feature initially below the surface is first exposed at
After the ice has receded , leaving the feature protruding in this model. The numbers are stipulated, not a measured etching rate or a recommended preparation setting.
A useful control compares matched specimens after different etching durations while recording specimen temperature, transfer conditions and coating geometry. Progressive exposure would be consistent with ice removal, but a different appearance can also arise from changed preparation or contamination. Condensation deposits material rather than removing it, so contamination must not be mistaken for an etched feature.
The ideal recession calculation assumes a uniform rate and an unchanged embedded feature. Real local composition and heat transfer can violate both assumptions. Interpret image contrast together with etching and coating history rather than assigning every relief feature directly to the initial specimen.
Freeze-fracture microscopy exposes internal structure by breaking a frozen specimen and examining the revealed face with electron microscopy. Freezing makes it possible to prepare a surface through material that would otherwise change substantially during ordinary handling in a vacuum. Physical applications include inspecting internal interfaces in frozen mixtures; the observed face is a fracture-selected surface rather than an arbitrary transparent section.[ref]
A preparation workflow freezes the specimen, fractures it while cold, and maintains protected low-temperature transfer. Optional freeze-etching removes surface ice by sublimation under vacuum. A thin oblique metal deposit supplies topographic contrast, with carbon providing support where a replica is required. The prepared block face can be examined with a scanning electron microscope, or a replica can be examined by transmission electron microscopy.[ref]
A geometrical illustration explains directional shadowing. Model deposition as parallel trajectories making angle above a flat surface. A protrusion of height casts a nominal shadow length
For an illustrative , gives , whereas gives about . These are ideal geometric predictions, not measured features or a calibration of a coating instrument. Finite coating thickness, trajectory spread and surface shape affect real contrast.
A useful preparation-control experiment compares otherwise matched frozen samples fractured and coated at different orientations, recording temperature history, etching time and deposition direction. Features that change with coating direction may reflect shadow geometry; features that change with freezing or etching conditions may reflect preparation. The fracture path can favor weak interfaces, and deposited material can obscure small structures, so apparent topography is not automatically an unbiased reconstruction of the original specimen.
The freeze-fracture electron microscopy article describes the replica route in more detail. Here the physical preparation and block-face comparison explain why the microscope image must be interpreted together with the specimen's preparation history.
Gisela Höflinger 2026-11-05
Gisela Höflinger is an author on electron microscopy specimen preparation. Her manufacturer-hosted profile identifies a background in industrial engineering and responsibility for a coating-instrument line at Leica Microsystems. Her 2014 tutorial Brief Introduction to Freeze Fracture and Etching by Gisela Höflinger explains the physical preparation steps behind images of frozen specimens.[ref]
The tutorial distinguishes freeze-fracture microscopy, which exposes an internal face by breaking a frozen specimen, from freeze-etching, which removes surface ice by sublimation. It describes angled heavy-metal deposition for topographic contrast, followed by a supporting carbon layer, and distinguishes viewing a block face by scanning electron microscopy from viewing a replica by transmission electron microscopy.[ref]
A geometrical example explains why coating angle matters. For a narrow deposition beam at angle above a flat surface, an ideal step of height casts a shadow of length . With and , that length is about 23 nm. This is a simplified shadow construction, not a reconstruction of data from the tutorial. It connects Höflinger's preparation topic to a practical problem: the recorded contrast depends on both specimen structure and the way its surface was coated.
Figure 1.
Gisela Höflinger, portrait labeled on her Leica Microsystems author profile
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