Past exam of the MPhil in micro- and nanotechnology enterprise course of the University of Cambridge / 2022 / Paper 1 / Section A(i) / 2 / i

In piezoresponse force microscopy, a conducting atomic force microscopy tip contacts a sample with a counter-electrode. Apply $V(t)=V_{\mathrm{dc}}+V_{\mathrm{ac}}\cos \omega t$. The converse piezoelectric effect produces an oscillatory displacement, approximately $u_{\omega }=d_{\mathrm{eff}}{V}_{\mathrm{ac}}$. Contact with the moving surface bends the cantilever, and a lock-in amplifier records the displacement amplitude and phase relative to the drive.

For opposite out-of-plane ferroelectric domains, the effective piezoelectric coefficient changes sign. Their vertical response therefore differs by approximately $180^{\circ }$ in phase. Equivalent antiparallel domains can have similar amplitudes, while cancellation or reduced response near a wall can produce an amplitude minimum. Phase identifies the relative response sign; an uncalibrated detector phase is not an absolute polarization direction.

Use a small drive below the switching threshold while imaging, a stable contact force and a well-characterized contact resonance. Electrostatic forces, contact stiffness and surface charging can also create signals at the drive frequency; observing contrast alone is insufficient evidence for polarization switching.^[ref]