Stimulated emission depletion microscopy narrows the region allowed to emit detectable fluorescence. A focused excitation pulse or beam populates the excited state. A red-shifted depletion beam with a central intensity minimum drives stimulated emission from the surrounding excited fluorophores. The stimulated photons are rejected from the fluorescence detection channel, leaving spontaneous emission concentrated near the depletion zero. Scanning this small effective emission region builds the image.[ref]
Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy by Stefan W. Hell and others. pp. 780–782, depletion of the outer excitation region and proposed beam geometry
Near an ideal zero, take depletion intensity proportional to squared radius. The radius at which it reaches a saturation scale decreases as the depletion amplitude grows. A common approximate resolution law iswhere is the undepleted characteristic width and depends on fluorophore kinetics and illumination timing. It is an idealized scaling, not a universal instrument calibration. For example, a threefold width reduction needs in this model. The illumination beams remain diffraction limited; nonlinear control of the emitting population creates the smaller effective response.
The cost is high depletion intensity, with possible photobleaching, phototoxicity and heating, demanding fluorophore photophysics, precise beam alignment and maintenance of the central zero. Point scanning limits speed and trades off field size, dwell time and photon statistics. Scattering and aberrations can fill the depletion minimum and degrade performance in depth. A simple lateral doughnut mainly improves lateral resolution; improved axial confinement requires an appropriate three-dimensional depletion pattern. Resolution gain is therefore conditional on usable photons, sample integrity and the actual depletion geometry.
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