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KIT's teaching apparatus uses a glass spoke-wheel or test negative as the object, a halogen lamp with an illuminating optical lens, an imaging optical lens, a screen and a triangular rail with a position scale. The illuminating optical lens concentrates the lamp filament's image on the imaging optical lens's centre; translucent paper checks that illumination. This reduces the contribution of peripheral light rays and their spherical aberration. The instructions require fixed object-screen separation exceeding $4f$, at least ten displacement measurements, and separate red- and blue-filter measurements to test chromatic aberration.^[ref]

The following measurement protocol elaborates that apparatus rather than reporting additional KIT results. Align the target centre, optical lens and screen normal along one optical axis; measure $L$ between the target pattern plane and receiving screen face. Lock the target and screen. Slide the imaging optical lens to obtain the enlarged real image, then the reduced real image, reading the same carrier reference mark at each setting. Record $r_{-},r_{+}$ and $d=r_{+}-r_{-}$ for each pair. Record corresponding target and image intervals to test the reciprocal transverse magnifications independently; merely observing different image sizes is a weaker test.

Use the same central target detail to judge best optical focus. Bracket each setting by moving through both visibly blurred sides, repeat from both travel directions, and record the accepted position range as well as repeat scatter. Rail divisions set a readout limit but do not alone specify focusing uncertainty. Check scale calibration, carrier play and drift; a common additive carrier offset cancels in $d$, whereas scale-factor error remains. Keep illumination, aperture, target, screen and optical lens orientation fixed within a series. Change the aperture and colour filter in separate control series: spherical aberration and chromatic aberration can shift the apparent best optical focus, while a very small aperture introduces stronger diffraction and makes focus discrimination harder. Record these settings alongside the inferred focal length, rather than interpreting all disagreement as random measurement error.

For a rigid thick lens in air, let $h=x_{H^{\prime }}-x_H$ be the signed separation of its rear and front principal planes along the direction of propagation. Then the positive object and image distances measured from the principal planes obey $u+v=L-h$. Translating the whole assembly without reversing it moves both principal planes equally, so the measured carrier displacement still equals the difference of the two solutions for $u$. The same algebra therefore givesHere $f$ is the effective focal length measured from the principal planes. This deduction uses the principal-plane imaging equation, not the uncorrected thin lens formula.^[ref] Mechanical centre thickness is not generally $h$. Record thickness and optical lens orientation, but use a justified bound or model for $h$ if it matters at the claimed precision. The two readings $L,d$ alone cannot determine both $f$ and unknown $h$; cancelling a carrier offset does not cancel this limitation.

The two principal planes are reference planes that represent a centred imaging system in the paraxial approximation. In air on both sides, measure object distance from the front principal plane, image distance from the rear principal plane, and focal length from each principal plane to its corresponding optical focus. They need not coincide with a surface or mechanical centre. Their signed separation matters in the Bessel lens displacement method.^[ref]

A thick lens retains the separation of its refracting surfaces when predicting image formation. In the paraxial approximation with air on both sides, object and image distances measured from the respective principal planes satisfy the familiar imaging equation. Measuring instead from one mechanical centre generally introduces an error.^[ref]