Lippmann fringe spacing

ID: lippmann-fringe-spacing

At normal incidence, let measure distance from the reflector into a uniform transparent layer with refractive index . For a monochromatic wave of vacuum wavelength , the layer wavenumber is . Represent the incident and returning electric fields by complex wave amplitudes with time factor suppressed:
The time-averaged squared electric field, normalized to the incident contribution, is
This electric exposure pattern has maxima separated by
The wave phase of the reflector shifts the maxima's positions but leaves their spacing unchanged in this uniform-layer model. The electric pattern, rather than the zero net energy flux of an ideal standing wave, is the relevant exposure proxy. An imperfect mirror reduces its contrast: , where denotes this exposure proxy.
Choose and . Then the medium wavelength is and . For an ideal phase-reversing reflector, and the normalized pattern is : its first two maxima are at and . These are chosen calculations, not measured properties of a historical photographic emulsion or the optical response of Mercury.
Figure 1.
A standing wave records depth fringes apart
. Original schematic and calculation for chosen , and an ideal phase-reversing mirror. The upper diagram distinguishes recording with a reflector from later reflected-colour readout. The lower plot shows the normalized electric exposure pattern, not a measured developed density profile. The first fringe position depends on reflector wave phase; the period does not. Material widths in the apparatus schematic are illustrative. Source. Details.
For multiple mutually incoherent wavelengths, time averaging adds exposure contributions rather than their instantaneous electric fields. In a linearized recording model,
Here is incident spectral exposure density, a wavelength-dependent recording sensitivity and a model exposure response. An optical spectrum therefore writes overlapping depth oscillations, not necessarily visibly separated sheets. This is a useful connection to the Fourier transform: approximately, depth is paired with optical spatial frequency . Finite recording depth, varying sensitivity and nonlinear photographic processing prevent treating this expression as an exact inversion rule for an actual plate.

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