 Phase calibration error in an admittance-based capacitance estimate

Phase calibration error in an admittance-based capacitance estimate can rotate a large in-phase conductance into a small capacitive quadrature. In the parallel port model $Y=G+i\omega C$ with $G\ge 0$, $C>0$, and the $e^{i\omega t}$ convention, a relative wave phase error $\delta$ gives $Y_{\mathrm{meas}}=Y{e}^{i\delta }$. The exact estimate in input capacitance inferred from measured admittance therefore has relative errorThe ratio $G/(\omega C)$, not the DC resistance alone, determines sensitivity to a small wave phase rotation. The manufacturer's separate differential/common-mode port models motivate specifying the terminals and operating point before fitting an input capacitance.^[ref]

If $|\delta |\le ϵ\le \pi /2$, the worst absolute relative error is bounded byThe negative endpoint $\delta =-ϵ$ attains this bound. For target relative error $r>1-\cos ϵ$, a sufficient frequency condition isThis condition assumes the same $G+i\omega C$ model and the same phase-error bound remain valid over that frequency range.

For an original planning example, take $G=1\mu \mathrm{S}$, $C=50\mathrm{pF}$ and $ϵ=0.5^{\circ }$. The bound is about $2.782\%$ at $1\mathrm{kHz}$ and $0.282\%$ at $10\mathrm{kHz}$. A one-percent target requires approximately $f\ge 2.788\mathrm{kHz}$ in this model. Increasing frequency suppresses the conductance-mixing term, but leaves the $1-\cos ϵ$ term and can expose other unmodelled parasitic effects.

A measurement uses the same voltage/current wave phase reference for the ratio $I/V$, checks that reference with a known port, and retains fixture admittance in the model or subtracts a validated value. Amplitude measurement calibration alone cannot establish this wave phase bound. The numbers above are chosen calculations, not device specifications or a claim that a high-frequency measurement is automatically more accurate.