X-ray diffraction is the angular redistribution of X-ray wave intensity through wave interference between scattered waves. In a crystal structure, repeated lattice translations select discrete outgoing directions by the Laue equations. A photographic plate can therefore turn invisible atomic periodicity into a visible constellation of spots. Their geometry constrains the Bravais lattice and its orientation; their wave intensities also depend on the crystal basis structure factor. Determining atomic positions belongs to X-ray crystallography and requires more information than recognizing a spot pattern.
The Laue X-ray diffraction experiment of 1912 established this phenomenon experimentally. The Laue method uses a fixed crystal structure with a range of incident wavelengths; the Bragg crystal reflection experiment of 1913 instead measured angularly resolved signals with a moving detector. These are different ways of finding the same coherent elastic scattering directions.
Often used as a synonym for X-ray crystallography, or to refer more specifically to the diffraction part of the experiment (exluding therefore sample preparation and data processing).
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