Christoph Gerber helped develop atomic force microscopy with Gerd Binnig and Calvin Quate. Their 1986 paper introduced an instrument that senses probe–sample forces through a compliant cantilever, enabling investigation of electrically insulating surfaces.[ref]
Atomic Force Microscope by Gerd Binnig and others. Original paper, byline, abstract and preliminary measurements
The mechanical probe makes a small interaction measurable through displacement: in a linear approximation, a cantilever of spring constant deflecting by carries force . Gerber's later research includes biochemical cantilever sensors, extending the same transduction principle from surface imaging to detection of molecular interactions.[ref]
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Christoph Gerber is a Swiss physicist known for his contributions to the field of nanotechnology and scanning probe microscopy. He is notably associated with the development of techniques related to atomic force microscopy (AFM), which allows for imaging and manipulating matter at the nanoscale. Gerber's work has implications in various fields, including materials science, biology, and nanotechnology.