Image-intensity variation produced when scattered and unscattered electron-wave amplitudes interfere after phase shifts from the specimen and imaging optics. It depends on defocus and aberrations.
Defocus-dependent edge fringes caused by propagation and interference of the electron wave. Their apparent width and sign can change with defocus, so they do not directly measure the thickness of a material shell.

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  1. Transmission electron microscopy contrast
  2. Transmission electron microscopy
  3. Electron microscopy
  4. Electron microscope
  5. Electron optics
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