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Heating promotes electrons across the band gap, creating mobile conduction electrons and electron holes. Their contributions add:where $u_e,u_h$ are the electron mobility and hole mobility, and $e$ is the positive elementary-charge magnitude. The increase in carrier density gives the rising electrical conductivity in the intrinsic activation regime. Mobility need not itself increase with temperature; the model attributes the dominant increase to carrier generation.

Charge carrier mobility measures weak-field drift speed per electric field. For electrons and electron holes,Both mobilities are positive, with SI units ${\mathrm{m}}^2{\mathrm{V}}^{-1}{\mathrm{s}}^{-1}$; the opposite drift signs reflect the opposite carrier charges. In a simple isotropic relaxation-time model, electron mobility is ${\mu }_e=e{\tau }_e/m_e^{\ast }$ and hole mobility is ${\mu }_h=e{\tau }_h/m_h^{\ast }$. These are momentum relaxation times, not the minority carrier lifetime for electron-hole recombination.

Scattering by phonons, ionized impurities and defects limits mobility. Increasing phonon populations commonly lowers mobility at high temperature; ionized-impurity scattering can dominate at low temperature and high semiconductor doping. Approximate addition of independent inverse relaxation times is the Matthiessen's rule. At sufficiently strong field, velocity saturation invalidates the constant-mobility drift law.

The Hall effect provides a measurement: a current-carrying bar in a perpendicular magnetic field develops a transverse voltage. In a one-carrier model $|R_H|=1/(en)$ and $\mu =\sigma |R_H|$, combining the transverse voltage with longitudinal electrical conductivity. Multiple carrier types and scattering-dependent Hall factors require a more detailed interpretation.