Past exam of the MPhil in micro- and nanotechnology enterprise course of the University of Cambridge / 2019 / Paper 1 / Section A(i) / 1 / iii / c / Solution

friction force microscopy is suitable. Contact scanning twists the AFM cantilever; the lateral photodetector difference measures friction and can distinguish the supported graphene and glass even if their heights are close. Acquire both trace and retrace and use half their lateral-signal difference to suppress slope-induced cross-talk. Keep the normal load low enough to avoid dragging or damaging the flake, control humidity and contamination, and calibrate torsional sensitivity if a quantitative coefficient of friction is required. An electrical connection is unnecessary.