Past exam of the MPhil in micro- and nanotechnology enterprise course of the University of Cambridge / 2020 / Paper 1 / Section A(i) / 1 / i / Solution

The atomic force microscope measures the cantilever deflection $d$, converted to normal force by $F=k_{c}d$ after calibration. On approach, the force is initially almost zero, then attractive; a sufficiently steep attractive force gradient causes jump-to-contact. After contact, further approach bends the cantilever and indents the sample, giving a rising repulsive branch. With tip-surface separation increasing to the right, approach proceeds from right to left. The instability occurs when the magnitude of the attractive force gradient exceeds the cantilever stiffness. The contact-branch slope depends on both cantilever and sample compliance.