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Incoming links: Reduced graphene oxide
Use low-voltage, preferably aberration-corrected HRTEM, with about 60–80 kV as a defensible operating range. An approximately 80 kV starting point balances useful lattice resolution against carbon displacement damage; use the lower end if the instrument still resolves the lattice and defect stability is the priority.
A higher accelerating voltage reduces the electron wavelength, but can remove carbon atoms by knock-on displacement. Measurements on pristine single-layer graphene show a strong increase in displacement probability above the vicinity of 80 kV, so simply selecting a conventional 200–300 kV setting is a poor way to preserve the original lattice.[ref]
Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene by Jannik C. Meyer and others. Beam-energy dependence of displacement cross sections, Physical Review Letters 108, 196102
reduced graphene oxide is already defective and chemically modified. Its vulnerable sites need not share the pristine-graphene threshold, and ionization, contamination and chemical etching remain possible at low voltage. Minimize dose, spread the beam while aligning and compare successive short exposures. The voltage choice suppresses one damage mechanism; it does not guarantee damage-free imaging.
Deposit a dilute dispersion onto a clean, electron-transparent TEM support and let the ethanol evaporate. A practical sequence is to redisperse gently, dilute enough to reduce overlap, place a small drop on a holey or lacey support grid, wick away excess liquid and dry thoroughly. Choose support chemistry compatible with wetting by ethanol.
Look for flakes spanning support holes, where no support film obscures the light-element lattice. Adjacent supported regions help locate and stabilize the flakes. Dilution reduces accidental multilayer stacks, while a clean grid and clean solvent reduce hydrocarbon background. Gentle agitation may be useful; prolonged aggressive sonication can itself change the defects one intends to measure.
Drying prevents a volatile liquid from entering the microscope vacuum. Additional cleaning must be chosen cautiously because heating or energetic plasma treatment can alter oxygen groups and defects in reduced graphene oxide. Record a low-dose survey before atomic-resolution imaging, and distinguish pre-existing defects from changes induced during acquisition.