Resolvent self-consistency defect (${\epsilon }_N(z)=g_N(z)+(z+g_N(z){)}^{-1}$)

For a zero-diagonal real symmetric matrix, put $q_i=x_i^T(X^{(i)}-zI{)}^{-1}{x}_i$ and $g_N=N^{-1}\mathrm{Tr}(X-zI{)}^{-1}$. The Schur complement formula for a diagonal resolvent entry gives $g_N=-N^{-1}{\sum }_i(z+q_i{)}^{-1}$. Subtracting the comparison value $-(z+g_N{)}^{-1}$ gives ${\epsilon }_N=N^{-1}{\sum }_i(q_i-g_N)/[(z+g_N)(z+q_i)]$. Upper-half-plane positivity and the principal minor resolvent trace bound control this defect by the average of $|q_i-g_N^{(i)}|$ plus a trace correction.