Photodiodes by Thorlabs Created 2026-10-18 Updated 2026-11-05
Technical document issued and hosted by Thorlabs. No individual author or publication or revision date is established. The 2020 URL component identifies an archive path, not a verified publication year. Indexed primary-document excerpts were inspected; direct opening returned an empty vendor page.
Cited passages: Lab Facts, Photodiode Saturation Limit and Noise Floor, Figures 1–3; Dark Current as a Function of Temperature, Experimental Setup and Experimental Limitations.
Photodiode Saturation and Noise Floor by Thorlabs Created 2026-10-18 Updated 2026-11-05
Technical document issued and hosted by Thorlabs. No individual author or publication or revision date is established. Indexed primary-document excerpts were inspected; direct opening returned an empty vendor page.
Cited passages: p. 7 of 12, Experimental Design — Noise Floor, and labelled apparatus schematic.
Additional indexed primary-document locator: Experimental Limitations, pp. 11–12. The indexed passage concerns one FDS100 silicon photodiode under continuous-wave illumination; its scope should be retained when interpreting the reported observations. The full vendor PDF remained unreadable through the browser used for this inspection.
Si photodiodes by Hamamatsu Photonics K.K. Created 2026-10-18 Updated 2026-11-05
Technical note issued and hosted by Hamamatsu Photonics K.K.. No individual author is credited. Page 17 states that the information is current as of December 2025; this is an information-currency date, not an established first-publication date.
Cited passages: pp. 2–3, §§1-1–1-2; p. 6, §§2-3–2-4; p. 7, §2-6; p. 9, §3-1 and Figure 3-1; p. 17, issuer and date statement.
Laboratory instructions issued by Physikalisches Grundpraktikum, Universität Leipzig and hosted on the university website. No individual author or instructor is credited. No publication or revision date is established.
Cited passages: PDF p. 1, Tasks 1 and 4 and instruments; pp. 5–6, Measurement of impedances and Figure 5; p. 6, final RC comparison instructions.
Institutional demonstration page credited to Harvard Natural Sciences Lecture Demonstrations, issued and hosted by Harvard University. No personal author or publication or revision date is established. Referenced authors on the page are not its authors.
Cited passages: How it works: two 45–90-degree prisms, transition as air film narrows, evanescent coupling; How it works: helium-neon laser, two perpendicular screens, clamp and explicitly unmeasured air gap; Setting it up: clean contact faces, corner protection and screen visibility.
Institutional laboratory instructions from University of Maryland Department of Physics, which hosts the document. No personal byline or separate institutional author credit is established. No publication or revision date is established; the course-path name and year do not establish an author, instructor or publication date.
Cited passages: p. 1, laser and photodiode, stepper controller and rotation stage, aperture-limited voltage and retroreflection alignment; p. 1, detector-voltage versus angle scanning and beam-position uncertainty; p. 2, Total Internal Reflection: semicircular block concentric with rotation axis, detector along flat face and strong/weak near-critical signals.
Instrument manual and experiment guide issued and hosted by PASCO scientific, manual 012-04695D. The cover title is Thermal Radiation System: Instruction Manual and Experiment Guide for Model TD-8553/8554A/8555. No personal author is credited.
Cover revision: March 1999 (03/99). Copyright 1988 is a separate date; no first publication date is established.
Cited passages: cover: model numbers, institutional issuer, revision 03/99 and copyright 1988; printed p. 1, Radiation Sensor: thermopile, millivoltmeter, shutter, reference heating and positioning; printed p. 3, Stefan-Boltzmann Lamp: approximate point source; printed pp. 9–10, Experiment 2, Fig. 2.1 and procedure: alignment, lamp-off ambient readings, lamp-on readings and heat-shield control; printed p. 11, Experiment 2 calculations: inverse squared distance comparison.
Thermopile detectors by Hamamatsu Photonics K.K. Created 2026-10-18 Updated 2026-11-05
Corporate technical note issued by Hamamatsu Photonics K.K., document KIRD9005E. No personal author or chapter byline is credited.
Information current as of May 2024, as printed on p. 6; this is not established as the first publication date. Hamamatsu Photonics hosts the document.
Cited passages: p. 2, §2 Structure: membrane absorber, reference junction locations and nonuniform temperatures; p. 2, Eq. (2-1): sum of thermocouple voltages; p. 3, §3-1 Sensitivity, Eq. (3-1): uniform illumination and localized spots; p. 3, §3-2 Noise, Eq. (3-2): resistance, absolute temperature and bandwidth; p. 6, institutional contact and information-current-as-of statement.
Whole-work authors: Sander Konijnenberg, Aurèle J.L. Adam and H. Paul Urbach. The author page credits A.P. Konijnenberg, A.J.L. Adam and H.P. Urbach and supplies their named biographies.
Issued by Delft University of Technology and hosted by its Interactive Textbooks platform. No publication date, revision date or edition is established.
Additional propagation locators: Scalar Diffraction Optics, Angular Spectrum Method, equations371–378, interactivetextbooks.tudelft.nl/interactive-optics/content/Chap6_Diffraction/DiffractiveOptics_2022_01Clean.html . The forward branch is tied to positive-z propagation and the negative-time-exponential convention; the chapter distinguishes propagating and evanescent components and states the vector divergence constraint.
Institutional laboratory guide issued by the Physics Advanced Lab of the University of California Berkeley, which hosts the webpage. No individual author or publication or revision date is established; the dynamic website copyright footer is separate.
Cited passages: Experimental Setup, LED, background and chopping geometry; Block Diagram I, chopper reference, photodiode, preamplifier, spectrum analyzer and lock-in amplifier; Experiment X, steps 2 and 9–13, reference search, LED-off comparison, frequency scan and external reference; Experiment XI, steps 1–8, alignment, overload, filtering and repeated readings; Interpreting the Data, points 1–3 and collection geometry. The source specifies apparatus and observations to make, without supplying measured numerical results.
Institutional manual issued and hosted by Stanford Research Systems, with SRS, Inc. printed on the cover. Revision 2.5, October 2011; the printed copyright years 1993 and 2011 are distinct from this revision date. No personal author is credited.
Cited passages: cover, imprint and revision; printed pp. 3-1–3-2, multiplication, synchronization, narrow-band detection, X and Y outputs and magnitude; p. 3-3, RMS or Peak? and Degrees or Radians?; pp. 3-11–3-12, time constants, roll-off, synchronous filters and settling; pp. 3-13–3-14, output normalization and displays.
Institutional educational slide issued and hosted by NASA Glenn Research Center. Its footer identifies curator and responsible-official roles, without establishing a personal author. No publication or revision date is established.
Cited passages: slide 27, partially filled Tygon tube with water; total and static pressure connections; direction of water displacement and height-difference readout. The slide documents an experimental method and qualitative prediction, without supplying measured results.
By Simon Foner. Review of Scientific Instruments, volume 30, issue 7, pp. 548–557, July 1959. The first-page byline gives Lincoln Laboratory, Massachusetts Institute of Technology as the author’s affiliation; it is not an institutional-author credit.
The scan host is w2agz.com, distinct from the journal and author.
Cited passages: p. 548: title, byline, venue and July 1959 publication metadata; pp. 549–550, §I and Figs. 1–2: perpendicular sample motion, loudspeaker drive, reference/sample pickup coils and positioning; p. 553, §IV and Fig. 9: null comparison and voltage-divider readout; p. 554, §§V.A–B: nickel saturation standard, position/shape limits, thermal noise and sample-removed holder correction; p. 556, §V.G and §VI.A.1: mechanical coupling, weighed specimen glued to mount and moment measurement. The inspected material is PDF text; figure pixels were not successfully inspected.
Institutional laboratory handout issued by New Jersey Institute of Technology, Electrical and Computer Engineering Undergraduate Laboratory, for ECE 494 Electrical Engineering Laboratory III. No individual byline or handout date is established.
Cited passages: Prelab, item 1; Experiments with Semiconductor Diodes, item 1, including readout and loading cautions; item 2(a), instrument comparison; Report and Analysis.
The Junction Diode by W. Marshall Leach, Jr. Created 2026-10-18 Updated 2026-11-05
By W. Marshall Leach, Jr.. Course notes for EE 3040 Microelectronic Circuits, Set 02.
The notes are undated. Summer 2005 dates the course-page class documents; it is not assigned as the PDF publication date. Georgia Institute of Technology hosts this personal material; the course page expressly disclaims institutional editing or publication.
Cited passages: §1.2, printed p. 4, equation (1.1); §1.3; §1.7, pp. 17–18; contents entry for §1.8; §1.11, p. 30; §1.12.1, pp. 30–31. The PDF chapter title is Chapter 2 while its printed section and equation prefixes are 1.
Institutional lesson by Toshiba Electronic Devices & Storage Corporation, in Basic Knowledge of Discrete Semiconductor Device, Chapter II: Diodes, lesson 2 of 13. No individual byline or lesson date is established; the website copyright footer is not a publication date.
Cited passages: opening paragraph; Figures 2-1(a), 2-1(c) and 2-2.
By Joel B. Fowler. Journal of Research of the National Institute of Standards and Technology, volume 100, issue 5, pp. 591–599, September–October 1995. Accepted 21 July 1995. NIST is the institutional issuer and the author’s affiliation.
The journal issue dates are used for publication; the catalogue’s 1 January 1995 timestamp is not the journal publication date. Its 17 February 2017 update dates the catalogue page.
Cited passages: §§2–3, printed pp. 592–593; §4.1 and Table 1, p. 594; §4.3 and Table 2, p. 595; About the author, p. 599.
By Raymond S. Castner, as credited on the PDF cover and title page. NASA/TM-2010-216259, April 2010; issued by NASA Glenn Research Center and hosted by the NASA Technical Reports Server. The associated conference occurred in August 2009.
Cited passages: §II, printed p. 2; §§IV–V, printed pp. 8–9; Figures 7–10; concluding remarks, printed p. 10.
Mach Angle (NASA Glenn Research Center) Created 2026-10-18 Updated 2026-11-05
Issued and hosted by NASA Glenn Research Center. The footer credits Tom Benson as editor and NASA official; no individual author byline is established. Last updated 13 May 2021, an online revision date.
Cited passages: wavefront geometry and displayed angle equations.
Schlieren Flow Visualization (NASA Glenn Research Center) Created 2026-10-18 Updated 2026-11-05
Issued and hosted by NASA Glenn Research Center. The footer credits Nancy Hall as editor and NASA official; no individual author byline is established. Last updated 13 May 2021, an online revision date.
Cited passages: slit source, two concave mirrors, knife edge and recording device; density-gradient contrast; dimensional interpretation.

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