Depletion-region generation current ($I_{\mathrm{gen}}\sim e\mathcal{A}W{n}_i/(2{\tau }_g)$)

Thermal generation of electron-hole pairs within a reverse-biased depletion region can supply a leakage electric current in addition to neutral-region diffusion. For a simple midgap trap with equal electron and hole lifetime parameters, its scale is $e\mathcal{A}W{n}_i/(2{\tau }_g)$, where $W$ is depletion width and ${\tau }_g$ the lifetime parameter. The electric field separates generated carriers. Unlike ideal diode minority-carrier diffusion current, this contribution scales approximately with $n_i$ rather than $n_i^2$ and can vary with reverse voltage through $W$. Consequently a measured activation energy need not equal the full band gap.