An electron-multiplying CCD adds a high-field multiplication register before the output amplifier. Impact ionization generates a large mean gain, reducing input-referred read noise but adding multiplication excess noise.
Random multiplication increases the noise relative to deterministic gain. If the output from one input electron has mean and variance , a Poisson distribution of input electrons with mean produces output variance , by the law of total variance. The high-gain analog-mode excess-noise factor is .
An energetic charge carrier creates an additional electron–hole pair. In a multiplication register this is stochastic, so the output charge fluctuates even when the input electron number is fixed.
For a direct-gap semiconductor with equal parabolic conduction-electron effective masses, restrict the final valence hole to zero crystal momentum and consider a normal process. Momentum conservation gives , while energy conservation gives with . The Cauchy-Schwarz inequality gives , so and the threshold is . Equal final wavevectors attain the bound; opposite spins allow the two electrons to occupy that wavevector. This is the threshold under the stated hole constraint, not the general threshold when the final hole can carry momentum.
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