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A gauge block is a physical length standard with carefully finished, approximately flat and parallel opposing measuring faces. Its calibrated length transfers a reference dimension to a comparator, a caliper or another measuring system. The nominal inscription identifies its intended size; the certificate supplies the measured departure and measurement uncertainty.^[ref]

The reference definition uses a block face wrung to an auxiliary plane and a specified point on the opposite face. Gauge block wringing also permits blocks to form a stack; the defined length convention includes a wringing layer. Clean contacts, the calibrated departures and the thermal conditions matter.^[ref]

An original stack uses nominal lengths $10\mathrm{mm}$, $2\mathrm{mm}$ and $1.5\mathrm{mm}$, giving nominal total $13.5\mathrm{mm}$. If their certified departures under compatible reference conditions are $+0.10$, $-0.04$ and $+0.02\mu \mathrm{m}$, the sum is $13.50008\mathrm{mm}$. The nominal sizes alone would omit the $0.08\mu \mathrm{m}$ correction. Combining uncertainties also requires their covariance, not just adding the certificate values.

For a separate illustrative thermal expansion calculation, a $100\mathrm{mm}$ block with stipulated linear expansion coefficient $11.5\times 10^{-6}{\mathrm{K}}^{-1}$ lengthens by $2.3\mu \mathrm{m}$ when heated by $2\mathrm{K}$. These are chosen model parameters, not a certificate for a particular block. NIST's handbook treats correction to the reference temperature $20{}^{\circ }\mathrm{C}$ and temperature differences in comparisons.^[ref]

NIST describes two complementary routes: optical interferometry establishes block lengths, while a differential length comparator transfers calibrated differences. The apparatus and thermal control determine which uncertainty contributions matter. Handling a block warms it; waiting for thermal equilibration is part of the measurement rather than idle time.^[ref]

John S. Beers is a NIST dimensional metrology researcher and coauthor, with Ted Doiron, of The Gauge Block Handbook by Ted Doiron and John S. Beers. Its preface explicitly attributes the handbook's single-wavelength interferometry discussion to Beers's work. The official publication record retains the name John S. Beers.^[ref]

A gauge block provides a physical length standard, but its calibrated length depends on a stated convention. The handbook defines length using a wrung auxiliary plane and discusses mechanical comparison as well as interferometry.^[ref] This makes contact geometry and gauge block wringing part of the measurement, rather than treating the artifact as an abstract number printed on a block.

An original comparison example uses a reference and unknown of nominal length $50\mathrm{mm}$. Let the reference's certified deviation from nominal be $+0.120\mu \mathrm{m}$, and let the corrected unknown-minus-reference difference be $-0.035\mu \mathrm{m}$. The inferred unknown deviation is then $+0.085\mu \mathrm{m}$.

For independent reference and comparison standard uncertainties $u_r=0.025\mu \mathrm{m}$ and $u_d=0.015\mu \mathrm{m}$,If five independent repeat comparisons reduce only the second contribution, the result becomesThe common reference contribution does not disappear by repeating the comparison. This gauge-block reference uncertainty floor illustrates why high measurement repeatability alone cannot establish the same numerical measurement uncertainty as a reference-free measurement. Correlated inputs require the corresponding covariance terms.^[ref]

These chosen numbers explain a calibration principle; they are not reported performance values for Beers's apparatus. His documented contribution concerns the measurement methods and their controlled realization, including the link between an optical observation and a defined physical length.

A nested wringing-repeatability study separates variation between independently prepared gauge block wringings from readout scatter within one unchanged wring. Repeating a detector reading many times does not sample the contact variability introduced by separating and rejoining the surfaces.

For $m$ wrings with $r$ readings each, an original balanced random effect model iswhere independent wring effects have variance ${\tau }^2$ and independent readout errors have variance ${\sigma }^2$. Assume stable conditions and independence between those levels. One-way analysis of variance givesThus $M{S}_W$ estimates readout variance and $(M{S}_B-M{S}_W)/r$ estimates the between-wring variance in this model. A negative variance estimate reflects sampling variability or model limitations, not a physically negative contact variance.

For a small invented data set, duplicate readings in nm relative to an arbitrary reference are $(-3,-1)$, $(1,3)$ and $(5,7)$. Wring means are $-2,2,6$; $M{S}_W=2$ and $M{S}_B=32$, so the method-of-moments between-wring variance is $15\mathrm{n}{\mathrm{m}}^2$. These are arithmetic examples, not a recommended sample size or a NIST calibration result.

For the overall mean of the balanced study,With stipulated $\tau =6\mathrm{nm}$, $\sigma =2\mathrm{nm}$, five wrings and four readings per wring, its standard deviation is $\sqrt{7.4}\approx 2.72\mathrm{nm}$. Increasing to forty readings on the same five wrings lowers it only to about 2.69 nm. Fifty wrings with four readings each would instead give about 0.86 nm, if the same model and stable preparation remain valid.

A shared reference or persistent preparation contribution does not disappear under either averaging rule. An independent common uncertainty $u_0$ adds $u_0^2$ to the displayed variance. This connects the nested study with the wringing-film covariance model and the gauge-block reference uncertainty floor.

NIST's handbook documents contact-layer dependence on preparation and time, including evolution after thermal equilibration.^[ref] Record rewringing events, timestamps and surface preparation; use appropriate controls for drift and damage. A nested contact-study allocation should balance new wrings against repeat readings, rather than treating every reading as an independent contact experiment.

A wringing-film covariance model specifies how uncertain effective contact-layer contributions vary together in a gauge block wringing measurement. Individual contact uncertainties do not determine the uncertainty of a stack unless their dependence is also specified.

Let the vector of contact differences be $\mathbf{\delta }=({\delta }_1,\dots ,{\delta }_n{)}^T$ and its covariance matrix be $\Sigma$. For a correction $\Delta ={\mathbf{c}}^T\mathbf{\delta }$, propagation givesThe coefficients encode the actual geometry and calibration subtraction. They need not all be positive. This is the general correlated-input law applied to wringing-film uncertainty.^[ref]

A simple original model writes ${\delta }_j=b+{ϵ}_j$, where one common contribution $b$ has variance $u_b^2$ and independent contact contributions have variance $u_{ϵ}^2$. ThenFor three equal-sign contacts with $u_b=3\mathrm{nm}$ and $u_{ϵ}=2\mathrm{nm}$, the variance is $93\mathrm{n}{\mathrm{m}}^2$. For a difference of two contacts with coefficients $(1,-1)$, the common contribution cancels and the variance is only $8\mathrm{n}{\mathrm{m}}^2$. These are chosen covariance structures, not universal properties of wrung surfaces.

Calibration and use can share only part of their contact history. If $n$ calibration contacts share effect $b_c$ and $n$ use contacts share effect $b_u$, their common-effect correction is $n(b_u-b_c)$. Its variance isPerfectly shared equal contributions cancel; independent preparation effects do not. Assuming either relation requires evidence about preparation, reference surfaces and measurement history.

Repeated readouts of one unchanged wring mostly probe readout scatter. Rewringing samples a different level of variability; changes of surface preparation or elapsed time may add another. The NIST handbook documents that contact layers depend on conditions and can evolve after thermal equilibration.^[ref] A nested wringing-repeatability study can help separate those levels, but repeatability data alone do not identify every shared calibration contribution.

Retain the covariance assumptions with the result and test whether the proposed matrix is a valid positive semidefinite matrix. A small combined uncertainty obtained by assigning cancelling correlations is meaningful only when those correlations describe the physical comparison.

Wringing-film uncertainty is the uncertainty contributed by differences or changes in the effective contact layers formed during gauge block wringing. Because the defined length of a gauge block includes a wringing-layer convention, the issue is the difference between calibration and use, not automatically an extra layer correction added to every certificate value.

For a stack of $n$ blocks wrung to an auxiliary plane, let $w_i$ denote each calibrated effective layer contribution and $w_j^{\prime }$ the contributions from the $n-1$ internal contacts plus the base contact in use. The residual contact correction isIts standard uncertainty requires a model for these differences. NIST's handbook describes dependence on surface condition, fluid and elapsed time, and notes residual uncertainty when an unknown block's layer is transferred through comparison with a master.^[ref]

An original model for $n$ effective contact differences writes ${\delta }_j=b+{ϵ}_j$, with one shared zero-mean contribution $b$ of variance $u_b^2$ and independent contact contributions ${ϵ}_j$ of variance $u_{ϵ}^2$. ThenThe common term grows quadratically in variance because every contact contains the same contribution. Treating all contacts as independent would omit their covariance.

For three contacts with stipulated $u_b=3\mathrm{nm}$ and $u_{ϵ}=2\mathrm{nm}$, the combined standard uncertainty is $\sqrt{9\cdot 9+3\cdot 4}=\sqrt{93}\approx 9.64\mathrm{nm}$. Assuming independence for three marginal uncertainties $\sqrt{13}\mathrm{nm}$ instead gives $\sqrt{39}\approx 6.24\mathrm{nm}$. The numerical difference comes entirely from the assumed shared effect; these values are illustrative, not a general wringing specification.

Repeatedly separating, preparing and rewringing contacts can characterize a repeatability contribution. Repeated detector readings of an unchanged stack do not sample new wrings. Averaging independent rewrings may reduce a random contact term while leaving a shared calibration or preparation contribution. Film evolution and thermal expansion during handling must also be distinguished from readout noise.

Report surface preparation, reference geometry, elapsed time and the treatment of shared effects. A stack that adheres firmly can still have a length contribution relevant to a small uncertainty target. Wringing-film covariance model assumptions therefore belong with the result, rather than being hidden inside an unspecified repeatability number.