Gerhard E. Dorda Created 2026-10-18 Updated 2026-11-05
An experimental physicist who coauthored the 1980 report of quantized Hall resistance. A two-dimensional electron gas in a silicon transistor exhibited reproducible Hall-resistance values, enabling comparison with fundamental constants. The result showed why the microscopic quality and confinement of a semiconductor device could matter to precision electrical measurement.[ref]
Klaus von Klitzing Created 2026-10-18 Updated 2026-11-05
Klaus von Klitzing coauthored the discovery of precisely quantized Hall resistance in a silicon device containing a two-dimensional electron gas. In a strong magnetic field, resistance plateaus followed values set by and an integer filling index, rather than changing smoothly with every microscopic device parameter. The 1980 work used the reproducibility for a precision-constants measurement. The integer quantum Hall effect thus connects a collective electronic state with a robust electrical reference.[ref]
Figure 1.
Portrait of Klaus von Klitzing
. Pontifical Academy of Sciences; 27 October 2015. CC BY-SA 4.0, via Wikimedia Commons. Source.
Michael Pepper Created 2026-10-18 Updated 2026-11-05
An experimental condensed matter physicist who coauthored the observation of quantized Hall resistance in a two-dimensional electron gas. A silicon transistor supplied the confined carriers; Hall-voltage measurements revealed plateaus insensitive to device geometry. The integer quantum Hall effect therefore connected an electronic transport experiment to precision determination of fundamental constants.[ref]
Klaus von Klitzing, G. Dorda and M. Pepper reported a silicon MOSFET measurement in 1980. Its gate controlled an semiconductor inversion layer; transverse contacts measured the Hall voltage and separate longitudinal contacts measured dissipation. One sweep held , and fixed while varying gate voltage. Hall plateaus accompanied small longitudinal voltages. Device-geometry comparisons and high-input-impedance voltage measurements helped test whether contact placement or electrical loading produced the result.[ref]
Figure 1.
Hall-bar contacts and gate-controlled channel
. Details.
This original functional diagram separates transverse and longitudinal readouts; it does not reproduce the historical device's dimensions. The gate inset explains how a field-effect transistor provides an adjustable two-dimensional electron gas. A longitudinal voltage close to zero is a useful check because accidental longitudinal separation between Hall contacts can otherwise contaminate the transverse measurement.