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The phase problem is the loss of the wave phases of the crystal basis structure factors when an experiment records their squared magnitudes. Write $F_{hkl}=|F_{hkl}|e^{i{\varphi }_{hkl}}$. A Fourier series reconstruction of a periodic electron density uses both $|F_{hkl}|$ and ${\varphi }_{hkl}$, whereas an ordinary wave intensity measurement supplies only $|F_{hkl}{|}^2$. Estimating the missing phases therefore needs additional constraints or measurements.^[ref]

There is also an unavoidable choice of origin. Translating all motif positions by the same fractional crystal coordinate vector $t$ multiplies $F_{hkl}$ by $e^{2\pi i(h,k,l)\cdot t}$ without changing $|F_{hkl}{|}^2$. The physical arrangement is unchanged. A reconstructed coordinate list must therefore distinguish a coordinate convention from information actually recovered from the measurements.

X-ray crystallographic structure inference is an inverse problem: infer a crystal structure from measured X-ray diffraction. A proposed unit cell and atomic basis of a crystal predict a pattern; structure determination asks which proposals survive comparison with that pattern. The useful separation is between directions and strengths. Peak positions constrain the reciprocal lattice and hence interplanar spacings; relative wave intensities constrain the motif through the crystal basis structure factor. Knowing a repeat distance does not locate all the chemical atoms within that repeat.

The lattice constant from two indexed reflections example isolates the geometric inference. Basis intensities and phase ambiguity then holds the translations fixed while changing the motif. Even complete, noiseless wave intensity data need not determine all wave phases: this is the phase problem. Chemical composition, symmetry, and additional measurements can supply constraints beyond the original pattern.^[ref]